Secondary Ion Mass Spectrometry: An Introduction to by Paul van der Heide

By Paul van der Heide

Serves as a pragmatic reference for these occupied with Secondary Ion Mass Spectrometry (SIMS)
• Introduces SIMS besides the hugely different fields (Chemistry, Physics, Geology and Biology) to it's utilized utilizing brand new illustrations
• Introduces the authorized basics and pertinent types linked to elemental and molecular sputtering and ion emission
• Covers the speculation and modes of operation of the instrumentation utilized in some of the sorts of SIMS (Static vs Dynamic vs Cluster ion SIMS)
• Details how info collection/processing will be conducted, with an emphasis put on tips on how to realize and steer clear of as a rule happening research triggered distortions
• Presented as concisely as believed attainable with All sections ready such that they are often learn independently of one another

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Additional resources for Secondary Ion Mass Spectrometry: An Introduction to Principles and Practices

Example text

Reprinted with permission from Finzi-Hart et al. (2009) Copyright 2009 National Academy of Sciences. Time-of-Flight-based SIMS instruments that have proved effective in this area include the Ion-Tof™ TOF-SIMS series, and the Physical Electronics nano-TOF and TRIFT™ series. These instruments provide the capability of analyzing higher mass secondary ions than possible in their Magnetic Sector-based counterparts and to retrospectively examine signals not originally thought of interest (in Magnetic Sector-based instruments, all signals of interest must be defined before the experiment).

55 × 1021 atoms∕cm3 . 99 × 1022 atoms∕cm3 . 2) NA is avogadros number, n the number of atoms in the empirical formula, that is, the simplest integer ratio of atoms of each element making up the solid, and Mr the molecular weight of the empirical unit. 2 ELECTRONIC STRUCTURE OF ATOMS AND IONS The electronic structure describes the energies and spatial location of all electrons bound within an atom, ion, or molecule. Electrons are bound to atoms through the 28 PROPERTIES OF ATOMS, IONS, MOLECULES, AND SOLIDS electromagnetic attraction to the respective nuclei (protons have positive charge, electrons have negative charge, and both spin around their own axis).

3 A schematic diagram illustrating the allowed energy levels (stationary states) for electrons bound to a free Arsenic atom (left), and those for electrons bound to Arsenic when present within the pure elemental solid (right). This bonding results in the formation of MOs as defined by the interaction of the valence electrons (4s and 4p levels). As metallic bonding occurs, pure Arsenic is defined as a metalloid (a nonmetal displaying metal-like properties). Reprinted with permission from van der Heide (2012) Copyright 2012 John Wiley and Sons.

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